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高低温老化测试系统 Burn-in and Test System
ESA专长于提供客户定制的老化测试设备。适用于半导体、航空航天、军事等领域对电子器件或模块的可靠性有较高的用户。ESA的老化测试设备可以对电子器件及模块进行批量的老化测试和生产。 |
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Dynamic Burn-in Board
• ATS Style
• Criteria Style
• ATS Compatible Style
Monitored Burn-in Board
• Aehr Max3 MBI Style
• JEC Style
• SSE Style
Test During Burn-in Board (TDBI)
• Aehr MTX Style
• Ando Style
Reliability Test Board
• 85°C/85% RH (Temperature/Humidity)
• Electromigration Hast Etc.
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Max 3 Burn-in and Test System
• Improves reliability by screening out process defects
• Provides JTAG and BIST testing
• Flexible architecture supports latest DSPs, microprocessors and memories
• For low voltage logic and System-on-a-Chip ICS
MXT Massively Parallel Test System
• Reduces final test cost
• Tests up to 10,000 memories in parallel
• Tests the latest technology memories including DDR and Rambus DRAMs, and SRAMs
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